TY  - CONF
A1  - Radtke, Martin
T1  - Evaluation of total reflection X-ray fluorescence (TXRF) analysis using a color X-ray camera (CXC)
T2  - 15th International Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF2013)
T2  - 15th International Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF2013)
CY  - Osaka, Japan
DA  - 2013-09-23
PY  - 2013
AN  - OPUS4-29859
LA  - deu
AD  - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany
ER  -