TY - JOUR A1 - Schreckenbach, J.P. A1 - Witke, Klaus A1 - Butte, D. A1 - Marx, G. T1 - Characterization of thin metastable vanadium oxide films by Raman spectroscopy T2 - Fresenius' journal of analytical chemistry PB - Springer CY - Berlin PY - 1999 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/2306 AN - OPUS4-2306 SN - 0937-0633 VL - 363 IS - 2 SP - 211 EP - 214 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany