TY - CONF A1 - Graf, Nora T1 - Surface analytical measurements (XPS, ToF-SIMS, NEXAFS) of organosilane functionalized substrates to be used as microarray platforms T2 - 11th Status Seminar "Chip Technologies" (Dechema) T2 - 11th Status Seminar "Chip Technologies" (Dechema) CY - Frankfurt am Main, Germany DA - 2009-03-05 PY - 2009 AN - OPUS4-19028 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -