TY  - CPAPER
A1  - Jaenisch, Gerd-Rüdiger
A1  - Bellon, Carsten
A1  - Ewert, Uwe
T1  - aRTist - Analytical RT Inspection Simulation Tool for Industrial Application
T2  - 17th World Conference on Non-Destructive Testing (Proceedings)
T2  - 17th World Conference on Non-Destructive Testing
CY  - Shanghai, China
DA  - 2008-10-25
KW  - Computer Simulation
KW  - Radiography
KW  - Computed Tomography
KW  - Ray Tracing
PY  - 2008
SP  - 1
EP  - 6
PB  - International Committee for Non-Destructive Testing
CY  - Shanghai
AN  - OPUS4-18584
LA  - eng
AD  - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany
ER  -