TY - JOUR A1 - Epishin, Alexander A1 - Link, T. A1 - Nolze, Gert T1 - SEM investigation of interfacial dislocations in nickel-base superalloys JF - Journal of microscopy N2 - A new technique for investigation of interfacial dislocations in nickel-base superalloys by scanning electron microscopy is presented. At high temperatures the pressure of interfacial dislocations against the γ/γ'-interface causes grooves. This 'fingerprint of the dislocation network' is visualized by deep selective etching, which removes the γ'-phase down to the γ/γ'-interface. Compared with transmission electron microscopy, the proposed method has important advantages: observation of large sample areas, no superposition of dislocations lying in different specimen depths, possibility of three-dimensional view of dislocation configurations, information about the dislocation mobility, reduced time for preparation and visualization. The method can be applied for multiphase materials where the interface is grooved by interfacial dislocations. KW - Dislocation structure KW - Interfaces KW - Nickel alloys KW - Scanning electron microscopy PY - 2007 SN - 0022-2720 SN - 1365-2818 VL - 228 IS - 2 SP - 110 EP - 117 PB - Blackwell CY - London AN - OPUS4-16039 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -