TY - CONF A1 - Renault, O. T1 - Synchrotron radiation induced X-ray photoelectron emission microscopy (SR-XPEEM) with abberation corrected energy filtering T2 - AVS 54th International Symposium T2 - AVS 54th International Symposium CY - Seattle, WA, USA DA - 2007-10-14 PY - 2007 AN - OPUS4-16006 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -