TY - JOUR A1 - Procop, Mathias A1 - Hodoroaba, Vasile-Dan A1 - Bjeoumikhov, A. T1 - Calculation of X-ray spectra for a side window tube JF - Microscopy and microanalysis T2 - Microscopy and Microanalysis CY - Chicago, IL, United States of America DA - 2006-07-30 KW - X-ray spectroscopy KW - X-ray tube KW - Microanalysis KW - XRF PY - 2006 DO - https://doi.org/10.1017/S143192760606123X SN - 1431-9276 SN - 1435-8115 VL - 12 IS - Supplement 2 PB - Cambridge University Press CY - New York, NY AN - OPUS4-12667 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -