TY - JOUR A1 - Emamverdi, Farnaz A1 - Yin, Huajie A1 - Smales, Glen Jacob A1 - Harrison, W. J. A1 - Budd, P. M. A1 - Böhning, Martin A1 - Schönhals, Andreas T1 - Polymers of intrinsic microporosity - Molecular mobility and physical aging revisited by dielectric spectroscopy and X‑ray scattering T2 - Macromolecules N2 - Polymers of intrinsic microporosity (PIMs) are promising candidates for the active layer in gas separation membranes due to their high permeability and reasonable permselectivity. These appealing properties originate from a microporous structure as a result of inefficient segment packing in the condensed state due to a combination of a ladder-like rigid backbone and sites of contortion. However, this class of polymers suffers from a significant decrease in the permeability with time due to physical aging, whereby typically, the permselectivity increases. The initial microporous structures approach a denser state via local rearrangements, leading to the reduction of the permeability. Hence, a detailed characterization of the molecular mobility in such materials can provide valuable information on physical aging. In this work, the dielectric behavior of PIM-1 films and their behavior upon heating (aging) were revisited by isothermal frequency scans during different heating/cooling cycles over a broad temperature range between 133 and 523 K (−140 to 250 °C). In addition, the obtained results were compared with data of samples that were annealed at ambient temperatures over different time scales. Multiple dielectric processes were observed: several relaxation processes due to local fluctuations and a Maxwell−Wagner−Sillars polarization effect related to the microporosity. The temperature dependence of the rates of all processes follows the Arrhenius law where the estimated activation energy depends on the nature of the process. The influence of the thermal history (aging) on the processes is discussed in detail. PB - American Chemical Society CY - Washington, DC KW - Polymers of intrinsic microporosity PY - 2022 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/55485 AN - OPUS4-55485 VL - 55 SP - 7340 EP - 7350 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany