TY - CONF A1 - Evans, Alexander A1 - Thiede, Tobias A1 - Mishurova, Tatiana A1 - Léonard, Fabien A1 - Laquai, René A1 - Ulbricht, Alexander A1 - Serrano Munoz, Itziar A1 - Müller, Bernd R. A1 - Bruno, Giovanni T1 - Non destructive characterization in Additive manufacturing N2 - An overview of non destructive characterisation in additively manufactured materials using computed tomography, refraction and diffraction based stress analysis T2 - BAM-IFW workshop CY - IFW Dresden, Germany DA - 28.03.2019 KW - Residual stress analysis KW - Additive manufacturing KW - Computed tomography KW - Diffraction KW - X-ray refraction PY - 2019 AN - OPUS4-49842 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -