TY - CONF A1 - Resch-Genger, Ute A1 - Würth, Christian A1 - Kaiser, Martin A1 - Kraft, Marco A1 - Pauli, Jutta A1 - Muhr, V. A1 - Hirsch, T. T1 - Challenges and examples for quantitative fluorescence measurements > 800 nm with semiconductor and lanthanide-doped nanocrystals N2 - There is an increasing interest in molecular and nanoscale with emission > 800 nm and recently also > 1000 nm for bioanalysis, medical diagnostics, bioimaging, and safety barcodes. Mandatory for the comparison of different emitter classes and the rational design of the next generation of reporters for the short wavelength infrared (SWIR) Region are reliable and quantitative photoluminescence measurements in this challenging wavelength region. This is of special relevance for nanocrystalline emitters like semiconductor quantum dots and rods as well as lanthanide-based upconversion and downconversion nanocrystals, where surface states and the accessibility of emissive states by quenchers largely control accomplishable photoluminescence quantum yields and hence, signal sizes and detection sensitivities from the reporter side. Such measurements are currently hampered by the lack of suitable methods and standards for instrument calibration and validation and quantum yield standards with emission > 800 nm and especially > 1000 nm. In this respect, we present the design of integrating sphere setups for absolute and excitation power density-dependent measurements of emission spectra and photoluminescence quantum yields in the wavelength Region of 650 to 1650 nm including calibration strategies and first candidates for potential fluorescence standards. Subsequently, the photoluminescence properties of different types of nanocrystals are presented including the upconversion and downconversion emission of differently sized and surface functionalized lanthanide-doped nanoparticles and photoluminescence quenching effects are quantified. T2 - SHIFT 2017 CY - Teneriffa, Spain DA - 13.11.2017 KW - Upconversion KW - Nanoparticle KW - Absolute fluorometry KW - Integrating sphere spectroscopy KW - NIR KW - IR KW - Fluorescence KW - Surface chemistry KW - Deactivation pathways KW - Semiconductor quantum dot KW - SWIR KW - Quantum yield PY - 2017 AN - OPUS4-43203 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -