TY - GEN A1 - Nolze, Gert A2 - Sen Gupta, S. P. A2 - Chatterjee, P. T1 - The determination of residual stress T2 - Powder diffraction : proceedings of the II International School on Powder Diffraction N2 - X-ray stress analysis on crystalline materials is based on the determination of elastic lattice strains. The strains described by the shift of peak positions are converted to stresses by the means of theory of elasticity. The development of the sin2ψ-method of X-ray stress analysis introduced an enormous progress in X-ray stress analysis during the last decades. This report outlines some important elements of X-ray physics and fundamentals of theory of elasticity. The Standard measuring procedure are described and special experimental differences to the common powder diffractometry are outlined. PB - Allied Publishers CY - Kolkata, India KW - XRD KW - Residual stress PY - 2002 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/38036 AN - OPUS4-38036 SN - 81-7764-262-6 SN - 9788177642629 SP - 77 EP - 83 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany