TY - CONF A1 - Laquai, René A1 - Müller, Bernd R. A1 - Kasperovich, G. A1 - Haubrich, J. A1 - Requena, G. A1 - Bruno, Giovanni T1 - Distinguishing characteristic defect in additively manufactured Ti-Al6-V4 with synchrotron X-ray refraction radiography N2 - Synchrotron X-ray refraction radiography (SXRR) is proven to identify different kinds of defects in Ti-Al6-V4 samples produces by selective laser melting. Namely, these defect types are empty pores and unprocessed powder, which are characteristic to the regions above and below the optimal laser energy density, respectively. Furthermore, SXRR detects small defects below the spatial resolution. T2 - BESSY User Meeting CY - Berlin, Germany DA - 13.12.2017 KW - Additive manufacturing KW - X-ray refraction KW - Porosity PY - 2017 AN - OPUS4-43446 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -