TY - CONF A1 - Radnik, Jörg A1 - Madkour, Sherif A1 - Lippitz, Andreas A1 - Schönhals, Andreas A1 - Unger, Wolfgang T1 - Anomalous surface composition in thin films of a poly(vinyl methyl ether) / polystyrene blend N2 - Highly surface-sensitive X-ray photoelectron spectroscopy at HE-SGM beamline revealed in the outermost region (< 2nm) of thin films (15 -65 nm) of PVME/PS blends a relative high amount of PS, whereas in slightly deeper regions PVME was enriched. Such enrichment of PVME in the whole near-surface region was proposed in former investigations based on conventional XPS studies. T2 - Bessy User Meeting 2017 CY - Berlin, Germany DA - 13.12.2017 KW - Energy resolved XPS KW - Depth profiling KW - Thin films KW - Polymer blends PY - 2017 AN - OPUS4-43443 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -