TY - CONF A1 - Müller, Bernd R. A1 - Kupsch, Andreas A1 - Laquai, René A1 - Nellesen, J. A1 - Tillmann, W. A1 - Kasperovich, G. A1 - Requena, G. A1 - Bruno, Giovanni T1 - Microstructure characterization of materials using X-ray refraction techniques N2 - X-ray imaging techniques have an enormous potential to understand the microstructure, its evolution, and its link to mechanical, thermal, and transport properties. In this lecture we report the use of a powerful, yet not so wide-spread, set of X-ray techniques based on refraction effects. X-ray refraction allows determining the internal specific surface of materials (surface per unit volume) in a non-destructive fashion, position and orientation sensitive, and with a nanometric detectability. We demonstrate showcases of ceramics and composite materials, where microstructural parameters could be achieved in a way unrivalled even by high-resolution techniques such as electron microscopy or computed tomography. We present in situ analysis of the damage evolution during tensile load and the identification of void formation in parts produced by selective laser melting. T2 - MIMENIMA Summerschool CY - TU-Bremen, Germany DA - 22.8.2018 KW - X-ray refraction KW - Cracks KW - Pores PY - 2018 AN - OPUS4-45790 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -