TY - CONF A1 - Müller, Anja A1 - Lippitz, Andreas A1 - Radnik, Jörg A1 - Dörfel, Ilona A1 - Sparnacci, K. A1 - Ritter, B. A1 - Kemnitz, E. A1 - Unger, Wolfgang T1 - Quantitative chemichal depth-profiling by synchrotron-radiation-XPS N2 - Synchrotron-radiation enables the adjustment of the XPS information depth and, thus, the visualization of depth profiles of the elemental composition within the first 10 nm of a surface. This project deals with the analysis of core-shell nanoparticles. It constitutes first steps towards a valid methodology for studying the surface chemistry of nanoparticles in a quantitative and accurate manner. T2 - Eighth Joint BER II and BESSY II User Meeting CY - Berlin, Germany DA - 07.12.2016 KW - XPS KW - Synchrotron KW - Depth-profiling KW - Core@Shell Nanoparticles PY - 2016 N1 - Geburtsname von Müller, Anja: Hermanns, A. - Birth name of Müller, Anja: Hermanns, A. AN - OPUS4-38782 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -