TY - JOUR A1 - de Oliveira Guilherme Buzanich, Ana A1 - Radtke, Martin A1 - Reinholz, Uwe A1 - Riesemeier, Heinrich A1 - Emmerling, Franziska T1 - Time- & spatial-resolved X-ray absorption fine structure (XAFS) spectroscopy in a single-shot – new analytical possibilities for in situ material characterization T2 - Journal of Synchrotron Radiation N2 - A new concept that comprises both time- and lateral-resolved X-ray absorption fine-structure information simultaneously in a single shot is presented. This uncomplicated set-up was tested at the BAMline at BESSY-II (Berlin, Germany). The primary broadband beam was generated by a double multilayer monochromator. The transmitted beam through the sample is diffracted by a convexly bent Si (111) crystal, producing a divergent beam. This, in turn, is collected by either an energy-sensitive area detector, the so-called color X-ray camera, or by an area-sensitive detector based on a CCD camera, in θ-2θ geometry. The first tests were performed with thin metal foils and some iron oxide mixtures. A time resolution of lower than 1 s together with a spatial resolution in one dimension of at least 50 µm is achieved. PB - International Union of Crystallography CY - Chester, UK KW - Time resolution KW - Single-shot XAFS PY - 2016 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/37089 AN - OPUS4-37089 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-370892 SN - 1600-5775 IS - 23 SP - 769 EP - 776 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany