TY - CONF A1 - Jaenisch, Gerd-Rüdiger A1 - Kolkoori, Sanjeevareddy A1 - Bellon, Carsten T1 - Quantitative simulation of back scatter X-ray imaging and comparison to experiments T2 - Proceedings of the 19th World Conference on Nondestructive Testing N2 - X-ray backscatter imaging is a well established NDT technique to inspect complex objects using only a single-sided access. In difference to conventional transmission X-ray radiography, the X-ray backscatter imaging utilizes the scattered radiation caused by the Compton scattering effect. In order to achieve high backscatter intensities from a test object, it is necessary to optimize the backscatter system parameters namely the angle between source and slit camera, the slit collimator system, the shielding between source and scatter camera, and the type of detector. In addition, the scatter phenomena in to the investigated object need to be understood. In this contribution, we present a Monte Carlo model McRay which considers all relevant single and multiple interactions of photons and electrons. This model can be used to simulate back scatter techniques. It allows not only calculating the scatter image for a given experimental setup but also registering the spectrum of the detected scattered photons. Both aspects are important to understand the imaging process, to interpret the results, and to optimize the backscatter camera investigated here. Additionally experimental results will be presented and compared with simulations. T2 - 19th World Conference on Nondestructive Testing CY - Munich, Germany DA - 13.06.2016 KW - Radiology KW - Back-scatter techniques KW - Simulation KW - Monte Carlo methods KW - Measurements PY - 2016 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-365897 SN - 978-3-940283-78-8 VL - 158 SP - 1 EP - 11 PB - Deutsche Gesellschaft für zerstörungsfreie Prüfung (DGZfP) CY - Berlin, Germany AN - OPUS4-36589 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -