TY - CONF A1 - Lecompagnon, Julien A1 - Hirsch, Philipp Daniel A1 - Rupprecht, C. A1 - Ziegler, Mathias ED - Mendioroz, A. ED - Avdelidis, N. P. T1 - Thermographic testing using 2D pseudo-random illumination and photothermal super resolution reconstruction T2 - Proceedings of SPIE N2 - Due to the diffusive nature of heat propagation in solids, the detection and resolution of internal defects with active thermography based non-destructive testing is commonly limited to a defect-depth-to-defect-size ratio greater than or equal to one. In the more recent past, we have already demonstrated that this limitation can be overcome by using a spatially modulated illumination source and photothermal super resolution-based reconstruction. Furthermore, by relying on compressed sensing and computational imaging methods we were able to significantly reduce the experimental complexity to make the method viable for investigating larger regions of interest. In this work we share our progress on improving the defect/inhomogeneity characterization using fully 2D spatially structured illumination patterns instead of scanning with a single laser spot. The experimental approach is based on the repeated blind pseudo-random illumination using modern projector technology and a high-power laser. In the subsequent post-processing, several measurements are then combined by taking advantage of the joint sparsity of the defects within the sample applying 2D-photothermal super resolution reconstruction. Here, enhanced nonlinear convex optimization techniques are utilized for solving the underlying ill-determined inverse problem for typical simple defect geometries. As a result, a higher resolution defect/inhomogeneity map can be obtained at a fraction of the measurement time previously needed. T2 - Thermosense: Thermal Infrared Applications XLIV CY - Orlando, Florida, USA DA - 05.04.2022 KW - Thermography KW - Super resolution KW - NDT KW - Material testing KW - Internal defects KW - DMD KW - DLP PY - 2022 DO - https://doi.org/10.1117/12.2618562 SN - 0277-786X VL - 12109 SP - 1 EP - 10 PB - SPIE AN - OPUS4-54909 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -