TY - CONF A1 - Jaenisch, Gerd-Rüdiger A1 - Wieder, Frank A1 - Vogel, Justus A1 - Ewert, Uwe A1 - Bellon, Carsten A1 - Messerschmid, Magdalena A2 - Xu, C. T1 - Scatter imaging – Simulation of aperture focusing by deconvolution T2 - Proceedings of 2017 IEEE far east NDT new technology and application forum (FENDT 2017) N2 - X-ray scatter imaging is a well-established NDT technique to inspect complex objects using only a single-sided access. We present a specially designed multi-slit scatter camera consisting of several twisted slits which are parallelly arranged in a metal block. The camera projects one image per slit to the digital detector array, where the images are overlaying each other. The aperture is corrected based on a de-convolution algorithm to focus the overlaying projections into a single representation of the object. To achieve high scatter intensities from an object, it is necessary to optimize the parameters of the scatter system by simulation. PB - IEEE CY - Piscataway, NJ T2 - IEEE Far East NDT New Technology & Application Forum CY - Xi'an, China DA - 22.06.2017 KW - Scatter imaging KW - Computer simulation KW - Aperture focusing KW - Deconvolution PY - 2018 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/48395 AN - OPUS4-48395 SN - 978-1-5386-1615-4 SP - 301 EP - 306 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany