TY - CONF A1 - Pauw, Brian Richard A1 - Breßler, Ingo A1 - Snow, T. A1 - Thünemann, Andreas T1 - Software- and instrument development for characterization of nano-(C)RMs N2 - This poster deals with improvements and characteriztion of small-angle scattering limitations, by looking at the trifecta of Data collection and uncertainty propagation, data analysis methodologies, and real-world tests. It is found that - with appropriate care and instrumentation - accuracies of 1% on mean nanomaterial sizes, and 10% on the size distribution width as well as the volume fraction can be achieved. T2 - BAM-PTB Workshop on Reference Nanomaterials CY - Berlin, Germany DA - 14.05.2018 KW - Small-angle scattering KW - Instrumentation KW - Methodology KW - MAUS KW - Data analysis KW - Data correction PY - 2018 AN - OPUS4-46107 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -