TY - CONF A1 - Müller, Bernd R. A1 - Kupsch, Andreas A1 - Bruno, Giovanni T1 - Microstructure characterization of materials using X-ray refraction techniques N2 - X-ray refraction is an excellent tool for the characterization of the microstructure of materials. However, there are only a few (synchrotron) laboratories in the world that use this technique for material characterisation. Therefore, the seminar will first explain the basic principles of X-ray refraction and the measurement techniques installed at the hard X-ray beamline BAMline at BESSY II (Berlin, Germany). This is followed by examples of investigations on fibre-reinforced plastic composites (CFRP) as well as ceramic (Cordierite, ZrO2-SiO2) and metallic materials (Ti-6Al-4V, Inconel). Some of the investigations were carried out both ex-situ and in-situ under mechanical and thermal load. The results are correlated with the mechanical properties of the materials. T2 - LNLS Users Group Seminar Series CY - Campinas, Brasil DA - 25.10.2022 KW - X-ray refraction KW - Analyzer-Based Imaging KW - BAMline PY - 2022 AN - OPUS4-56117 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -