TY - GEN A1 - Pauli, Jutta T1 - Certified Fluorescence Quantum Yield Standards as New Optical Reference Materials N2 - Luminescence techniques are amongst the most commonly used analytical methods in life and material sciences due to their sensitivity and their nondestructive and multiparametric character. Photoluminescence signals are, however, affected by wavelength, polarization and time dependent instrument specific effects, and provide only relative intensities. This hampers the comparability of fluorescence measure-ments and calls for simple tools for instrument characterization and the quantification of measured fluorescence intensities. Well characterized fluorescence standards for instrument calibration and performance validation (IPV) can be used as references for fluorescence signals. Of special importance is the correct determination of photoluminescence quantum yields (QF) (number of emitted per absorbed photons) that provides a direct comparison of the fluorescence efficiency of emitters. Such well characterized standards have been successfully developed by BAM for the relative determination of f values of transparent solutions of molecular and nanoscale emitters in the wavelength range from 350 and 1100 nm and will be soon certified. These standards can also be used to evaluate integrating sphere setups, which are increasingly being used for absolute measurements of QF values. T2 - ANAKON 2019 CY - Münster, Germany DA - 25.03.2091 KW - Fluoreszenz KW - Referenzmaterial PY - 2019 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/47795 AN - OPUS4-47795 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany