TY - JOUR A1 - Ziegler, Mathias A1 - Thiel, Erik A1 - Studemund, T. T1 - Thermography using a 1D laser array – From planar to structured heating T2 - Materials Testing N2 - In the field of optically excited thermography, flash lamps (impulse shaped planar heating) and halogen lamps (modulated planar heating) have become established for the specific regimes of impulse and lock-in thermography. Flying-spot laser thermography is implemented by means of a rasterized focused laser, e. g. for crack detection (continuous wave operation) and photothermal material characterization (high-frequency modulated). The availability of novel technologies, i. e. fast and high-resolution IR cameras, brilliant innovative light sources and high-performance data acquisition and processing technology will enable a paradigm shift from stand-alone photothermal and thermographic techniques to uniform quantitative measurement and testing technology that is faster and more precise. Similar to an LED array, but with irradiance two orders of magnitude higher, a new type of brilliant laser source, i. e. the VCSEL array (vertical-cavity surface-emitting laser), is now available. This novel optical energy source eliminates the strong limitation to the temporal dynamics of established light sources and at the same time is spectrally clearly separated from the detection wavelength. It combines the fast temporal behavior of a diode laser with the high optical irradiance and the wide illumination area of flash lamps. In addition, heating can also be carried out in a structured manner, because individual areas of the VCSEL array can be controlled independently of each other. This new degree of freedom enables the development of completely new thermographic NDT methods. PB - Carl Hanser Verlag CY - München KW - Thermography KW - Laser thermography KW - Laser KW - Lock-in KW - VCSEL KW - Thermal wave KW - Photothermal PY - 2018 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/45482 AN - OPUS4-45482 UR - https://www.hanser-elibrary.com/doi/abs/10.3139/120.111209 SN - 0025-5300 VL - 60 IS - 7-8 SP - 749 EP - 757 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany