TY - CONF A1 - Schade, U. A1 - Puskar, L. A1 - Ritter, E. A1 - Beckmann, Jörg T1 - Etalon effects in THz film measurements T2 - 2020 45th international conference on infrared, millimeter, and terahertz waves (IRMMW-THz) - Proceedings N2 - Etalon effects in THz transmittance spectra, either taken in time- domain or frequency-domain, often hamper or even hinder the interpretation of film properties. In this paper we discuss the transferability and applicability of spectroscopic methods typically employed in the near and mid infrared spectral range to eliminate the fringes in the transmittance spectra in the THz spectral range. PB - IEEE CY - Buffalo, NY T2 - 2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) CY - Buffalo, NY, USA DA - 08.11.2020 KW - THz radiation KW - Total transmittance reflection technique KW - Etalon effects PY - 2020 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/56943 AN - OPUS4-56943 SN - 978-1-7281-6620-9 SN - 2162-2035 SN - 2162-2027 SP - 1 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany