TY - GEN A1 - Hansen, B. A1 - Hodoroaba, Vasile-Dan T1 - Analysis of a certified copper alloy with Micro-XRF on SEM N2 - Copper alloys have found widespread application in various fields. The elemental composition determines the properties of the alloys and consequently their application. Therefore, knowing the composition of a copper alloy is very important. Metrological institutes like the BAM (German Federal Institute for Materials Research and Testing) offer reference materials that can be used to prove the accuracy of the applied analysis method. The aim of this application note is to demonstrate how Micro-X-ray fluorescence spectroscopy (Micro-XRF) expediently supplements the analysis of copper alloys by using Bruker’s micro-focus X-ray source XTrace attached to a scanning electron microscope (SEM) and operating with an energy dispersive spectrometer. KW - XRF KW - µ-XRF KW - SEM/EDX KW - Copper alloy PY - 2018 UR - https://www.bruker.com/fileadmin/user_upload/8-PDF-Docs/X-rayDiffraction_ElementalAnalysis/Microanalysis_EBSD/LabReports/App_mxrf_sem_03_analysis_Cu_alloy_lores.pdf SP - 1 EP - 4 PB - Bruker Nano GmbH CY - Berlin AN - OPUS4-44677 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -