TY - JOUR A1 - Procop, Mathias A1 - Hodoroaba, Vasile-Dan T1 - Uncertainties in secondary fluorescence correction in EPMA T2 - Microscopy and Microanalysis N2 - Secondary fluorescence is an inevitable effect that has to be taken into account in any algorithm for quantitative electron probe microanalysis (EPMA) as an additional correction. Moreover, secondary fluorescence worsens spatial resolution of EPMA. Secondary fluorescence is excited both by characteristic radiation and by the X-ray continuum. In most cases the correction is small. There are, however, cases, e.g. the determination of low heavy metal concentration in a light matrix, where the contribution of secondary fluorescence exceeds 10% of the measured X-ray line intensity. For secondary fluorescence correction the measured X-ray line intensity has to be divided by the correction factor (1+I_flchar/I_p +I_flcont/I_p )≈(1+I_flchar/I_p )(1+I_flcont/I_p ) in order to get those intensity I_p, which is excited only by the primary electrons. I_flchar and I_flcont mean the calculated characteristic and continuums fluorescence intensities. In order to get the intensity of fluorescence radiation, the absorption of the exciting radiation in the specimen, the photoionization probability and the self-absorption of the emitted line must be calculated. The critical quantity is the X-ray yield of the exciting atoms in case of fluorescence by characteristic radiation and the bremsstrahlung yield of the specimen in case of continuum fluorescence. In the former case it is reasonable to apply the same physical model to calculate I_flchar and I_p. PB - Cambridge University Press KW - EPMA KW - Secondary fluorescence correction KW - Uncertainties KW - Microanalysis PY - 2019 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/48863 AN - OPUS4-48863 UR - https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/uncertainties-in-secondary-fluorescence-correction-in-epma/AA92E973D350A74C574067AAFB2D9044 SN - 1431-9276 SN - 1435-8115 VL - 25 IS - Suppl. 2 SP - 2360 EP - 2361 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany