TY - JOUR A1 - Szymoniak, Paulina A1 - Gawek, Marcel A1 - Madkour, S. A1 - Schönhals, Andreas T1 - Confinement and localization effects revealed for thin films of the miscible blend Poly(vinyl methyl ether) / Polystyrene with a composition of 25/75 wt% T2 - European Physics Journal E N2 - Thin films (200-7nm) of the asymmetric polymer blend poly(vinyl methyl ether) (PVME)/polystyrene (PS) (25/75wt%) were investigated by broadband dielectric spectroscopy (BDS). Thicker samples ([Formula: see text]37 nm) were measured by crossed electrode capacitors (CEC), where the film is capped between Al-electrodes. For thinner films ([Formula: see text]37 nm) nanostructured capacitors (NSC) were employed, allowing one free surface in the film. The dielectric spectra of the thick films showed three relaxation processes ( [Formula: see text] -, [Formula: see text] - and [Formula: see text] -relaxation), like the bulk, related to PVME fluctuations in local spatial regions with different PS concentrations. The thickness dependence of the [Formula: see text] -process for films measured by CECs proved a spatially heterogeneous structure across the film with a PS-adsorption at the Al-electrodes. On the contrary, for the films measured by NSCs a PVME segregation at the free surface was found, resulting in faster dynamics, compared to the CECs. Moreover, for the thinnest films ([Formula: see text]26 nm) an additional relaxation process was detected. It was assigned to restricted fluctuations of PVME segments within the loosely bounded part of the adsorbed layer, proving that for NSCs a PVME enrichment takes place also at the polymer/substrate interface. PB - Springer KW - Thin polymer films KW - Broadband dielectric spectroscopy PY - 2019 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/48651 AN - OPUS4-48651 SN - 1292-895X VL - 42 IS - 8 SP - 101, 1 EP - 11 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany