TY - CONF A1 - Radnik, Jörg A1 - Benettoni, P. A1 - Stryhanyuk, H. A1 - Wagner, S. A1 - Hachenberger, Y. A1 - Jungnickel, H. A1 - Tentschert, J. T1 - Analytical and Characterisation Excellence in nanomaterial risk assessment: A tiered approach Task2.5 N2 - The final results of Task 2.5 "Optimization of sample preparation for characterization of ENPs using TOF-SIMS under real-life conditions (a.) UfZ: polymer template; b.) BAM: pressing of pellets)" were presented. T2 - ACEnano General Meeting CY - Amsterdam, The Netherlands DA - 05.03.2020 KW - Nanoparticles KW - ToF-SIMS KW - Preparation PY - 2020 AN - OPUS4-50572 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -