TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Radnik, Jörg T1 - Surface Analysis and Context of the New HAXPES@BAM N2 - The Competence Centre nano@BAM is presenting a new X-ray Photoelectron Spectrometer – the HAXPES (XPS at hard energy) – for researching advanced materials at the nanoscale. With HAXPES detailed chemical information can now be gained not only from the first outermost nanometres of the sample surface, but also from deeper regions. Top international experts will share their knowledge and key findings on how to utilise HAXPES for exploring the surface of various advanced materials. Following the lectures, we will show you a short demo of the new instrument and answer your questions. T2 - Inauguration of the HAXPES@BAM - A new Hard-X-Ray Photoelectron Spectrometer CY - Online meeting DA - 25.01.2022 KW - XPS KW - HAXPES KW - Nano@BAM KW - Surface Analysis PY - 2022 UR - https://www.bam.de/Content/EN/Events/2022/2022-01-25-hapex.html AN - OPUS4-54377 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -