TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Rades, Steffi A1 - Natte, Kishore A1 - Orts Gil, Guillermo A1 - Unger, Wolfgang T1 - Morphology of nanoparticles - A characterization using high-resolution SEM T2 - GIT Imaging & Microscopy N2 - Potential candidates of reference nano-materials are manufactured and systematically characterized in particular with respect to their morphology (shape, size and size distribution) in the frame of the running large European project NanoValid. By exploiting the transmission operation mode in a SEM, known as T-SEM, it is demonstrated by means of three representative examples of nanoparticles how a quick morphological inspection up to a complete, metrological characterization is feasible. PB - GIT-Verl. CY - Darmstadt KW - Nanoparticles KW - SEM KW - TEM KW - T-SEM KW - NanoValid PY - 2013 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/27925 AN - OPUS4-27925 SN - 1439-4243 SN - 1863-7809 VL - 15 IS - 1 SP - 54 EP - 56 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany