TY - GEN A1 - Nolze, Gert T1 - EBSD: more reliable and accurate N2 - The presentation discusses numerous new approaches in order to increase precision and accuracy of electrom backscatter diffraction measurements. T2 - 1st EBSD Workshop CY - Belo Horizonte, Brazil DA - 17.09.2015 KW - Orientation mapping KW - Electron backscatter diffraction KW - Lattice parameter determination KW - Orientation precision KW - Orientation noise PY - 2015 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/37797 AN - OPUS4-37797 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany