TY - GEN A1 - Ortel, Erik T1 - Shape recognition of nanoparticles by high-resolution SEM and TSEM T2 - International summer workshop Nanoscience meets Metrology T2 - International summer workshop Nanoscience meets Metrology CY - Erice, Italy DA - 2015-07-27 PY - 2015 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/34705 AN - OPUS4-34705 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany