TY - GEN A1 - Weinel, Kristina T1 - Damage induced by electric field of microparticles in the electron microscope N2 - Damage induced by electric field (DIEF) that happens in the transmission electron microscope (TEM) when converging the electron beam (e-beam) on microparticles (MPs) can be used to synthesis new nanomaterial and nanomaterial compositions. The research questions are to clarify the limits and possibilities of the method regarding materials that can be produced, systems to which it is applicable and working beam parameters. Synthesis of nano-objects from microparticles using DIEF in TEM could be shown for different materials. Additionally, DIEF using the e-beam in a scanning electron microscope (SEM) can also be used to synthesis nano-objects. A deeper material analysis of this nano-objects was done using TEM and shows that the material of the nanoparticles (NPs) can be gold or/and silicon. Furthermore, the size of the NPs depends on the distance to the center of DIEF whereby the larger NPs are closer to the center. The areas of gold NPs are promising candidates for plasmonic or photonic devices for energy storage or transport. T2 - PhD-Day 2022 CY - Berlin, Germany DA - 06.09.2022 KW - Electron microscopy KW - Electron beam induced modification KW - Gold nanoparticles PY - 2022 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/58264 AN - OPUS4-58264 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany