TY - JOUR A1 - Winkelmann, A. A1 - Nolze, Gert A1 - Cios, G. A1 - Tokarski, T. T1 - Mapping of local lattice parameter ratios by projective Kikuchi pattern matching T2 - Physical review materials N2 - We describe a lattice-based crystallographic approximation for the analysis of distorted crystal structures via Electron Backscatter Diffraction (EBSD) in the scanning electron microscope. EBSD patterns are closely linked to local lattice parameter ratios via Kikuchi bands that indicate geometrical lattice plane projections. Based on the transformation properties of points and lines in the real projective plane, we can obtain continuous estimations of the local lattice distortion based on projectively transformed Kikuchi diffraction simulations for a reference structure. By quantitative image matching to a projective transformation model of the lattice distortion in the full solid angle of possible scattering directions, we enforce a crystallographically consistent approximation in the fitting procedure of distorted simulations to the experimentally observed diffraction patterns. As an application example, we map the locally varying tetragonality in martensite grains of steel. PB - American Physical Society CY - College Park, MD KW - EBSD KW - Scanning electron microscopy KW - Orientation refinement PY - 2018 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/47296 AN - OPUS4-47296 SN - 2475-9953 VL - 2 IS - 12 SP - 123803, 1 EP - 15 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany