TY - CONF A1 - Rockenhäuser, Christian A1 - Schriever, Sina A1 - Piesker, Benjamin A1 - Skrotzki, Birgit T1 - Quantitative determination of microstructural parameters from TEM – Part II N2 - Presentation of quantitative microstructural parameter determination from Transmission electron microscopy (TEM) T2 - DFG Priority Program 1713 Docus Group Meeting CY - Berlin, Germany DA - 27.06.2016 KW - Dark-field transmission electron microscopy (DFTEM) KW - 2618A KW - S-Phase KW - Volume fraction KW - Microstructure PY - 2016 AN - OPUS4-36706 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -