TY - GEN A1 - Seeger, Stefan T1 - Instruments for Fine and Ultrafine Particle Emission Characterization N2 - An overview on instruments and methods for the measurement and chemical characterization of particulate emissions from local sources is presented T2 - BAM - JBMIA (Japan Business Machine and Information System Industries Association) Meeting, JBMIA Emissions Working Group Meeting CY - Tokyo, Japan DA - 04.05.2019 KW - Aerosol spectroscopy KW - Particulate emission KW - Chemical analysis KW - Total reflection X-ray spectroscopy KW - Calibration PY - 2019 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/47816 AN - OPUS4-47816 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany