TY - CONF A1 - Beckmann, Jörg A1 - von Chrzanowski, Lars A1 - Fratzscher, Daniel A1 - Ewert, Uwe ED - Thompson, D. O. ED - Chimenti, D. E. T1 - Spectral and spatial nondestructive examination of dielectric materials with THz time domain spectroscopy T2 - Review of progress in quantitative nondestructive evaluation, volume 31 N2 - A time domain spectrometer T-ray 2000® operating in the range of 0.2-2 THz was used for Time of Flight measurements. A series of ethanol water mixtures from 10% to 90% were produced subsequently filled in polystyrene cells and analyzed in the T-ray 2000 TDS system in the reflection mode. The reflectivity of the material liquid interface is strongly influenced by the ethanol concentration in water. The reciprocal reflection coefficient of the material liquid interface was found to be a useful discriminating feature for further Probably of Detection calculations which can be used for the performance evaluation of potential THz bottle scanners. THz pulse echo (PE) measurements were performed in comparison to the established ultra sound PE technique for flaw detection of plastics. Synthetic aperture reconstructions were applied for simulated data to reconstruct the flaw shape. The results were compared with B-scan images of a high density polyethylene (HDPE) test cylinder. Existing restrictions on the quality of the back projected images and limits of the existing model are discussed in detail. T2 - 38th Annual Review of Progress in Quantitative Nondestructive Evaluation CY - Burlington, VT, USA DA - 17.07.2011 KW - Terahertz time domain spectroscopy KW - Time of flight diffraction KW - Non destructive testing KW - Polymers KW - Probability of detection KW - Thz Tomography PY - 2012 SN - 978-0-7354-1013-8 DO - https://doi.org/10.1063/1.4716279 SN - 0743-0760 SN - 0094-243X N1 - Serientitel: AIP conference proceedings – Series title: AIP conference proceedings VL - 31A IS - 1430 SP - 573 EP - 580 PB - American Institute of Physics CY - Melville, NY AN - OPUS4-26103 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -