TY - GEN A1 - Onel, Yener A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen T1 - Experiences in using a 320 kV micro focus X-ray tube and a large sized amorphous silicon detector for 3D-CT T2 - International Symposium on Computed Tomography and Image Processing for Industrial Radiology N2 - A novel 3D-CT scanner was set up at BAM to extend the applicability of the X-ray transmission microtomography (µ-CT) to specimens up to 30 cm in diameter. The scanner consists of a bipolar 320 kV micro focus tube and a flat panel detector of amorphous silicon. Minimisation of scattered radiation, control of room and system temperature, and corrective preprocessing on the projection data are necessary to achieve expectable CT images. Statistical evaluations to show the limits and results of CT investigations are reported. T2 - International Symposium on Computed Tomography and Image Processing for Industrial Radiology CY - Berlin, Germany DA - 2003-06-23 PY - 2003 UR - http://www.ndt.net/article/ct2003/v06/v06.htm SN - 3-931381-48-X N1 - Serientitel: DGZfP-Proceedings BB – Series title: DGZfP-Proceedings BB IS - 84-CD SP - 53 EP - 59 PB - DGZfP CY - Berlin AN - OPUS4-2875 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -