TY - CONF A1 - Onel, Yener A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen T1 - Experiences in using a 320kV micro focus X-ray tube and a large sized amorphous silicon detector for 3D-CT T2 - International Symposium on Computed Tomography and Image Processing for Industrial Radiology T2 - International Symposium on Computed Tomography and Image Processing for Industrial Radiology CY - Berlin, Germany DA - 2003-06-23 PY - 2003 AN - OPUS4-3810 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -