TY - CONF A1 - Unger, Wolfgang T1 - Metrology for Nano-Analysis: Establishing Reference Methods for Characterizing Nano-Materials T2 - Workshop on Advanced Characterization of Nanomaterials T2 - Workshop on Advanced Characterization of Nanomaterials CY - Zaragoza, Spain DA - 2013-09-19 PY - 2013 AN - OPUS4-29865 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -