TY - GEN A1 - Schulz, Eckhard A1 - Sturm, Heinz A1 - Stark, Wolfgang A1 - Bovtun, V. A2 - Xia, Z. T1 - Determination of electric properties of heterogeneous systems using the contact and noncontact scanning force microscopy (SFM) T2 - Proceedings of the 9th International Symposium on Electrets N2 - With an extended contact and non-contact mode scanning force microscope samples with different heterogeneous electrical properties can be characterized. The contact mode method allows the determination of local electric conductivities of heterogeneous systems at the sample surfaces. An interpretation of this behaviour can be obtained in combination with other SFM modes such as topography, friction and compliance used simultaneously. The non-contact mode SFM allows to get more information about the local surface charge of heterogeneous samples. In this paper two new SFM approaches will be discussed on examples of carbon-fibre reinforced, organic and ceramic materials PB - IEEE Service Center CY - Piscataway, NJ T2 - 9th International Symposium on Electrets (ISE 9) CY - Shanghai, China DA - 1996-09-25 PY - 1996 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/6852 AN - OPUS4-6852 SN - 0-7803-2695-4 SP - 334 EP - 339 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany