TY - JOUR A1 - Reiche, I. A1 - Castaing, J. A1 - Calligaro, T. A1 - Salomon, J. A1 - Aucouturier, M. A1 - Reinholz, Uwe A1 - Weise, Hans-Peter T1 - Analyses of hydrogen in quartz and in sapphire using depth profiling by ERDA at atmospheric pressure: Comparison with resonant NRA and SIMS JF - Nuclear instruments and methods in physics research B N2 - Hydrogen is present in anhydrous materials as a result of their synthesis and of their environment during conservation. IBA provides techniques to measure H concentration depth profiles allowing to identify various aspects of the materials including the history of objects such as gemstones used in cultural heritage. A newly established ERDA set-up, using an external microbeam of alpha particles, has been developed to study hydrated near-surface layers in quartz and sapphire by non-destructive H depth profiling in different atmospheres. The samples were also analysed using resonant NRA and SIMS. KW - Hydrogen KW - Gemstones KW - ERDA KW - External beam KW - Depth profiling PY - 2006 DO - https://doi.org/10.1016/j.nimb.2006.03.066 SN - 0168-583X SN - 1872-9584 VL - 249 IS - 1-2 SP - 608 EP - 611 PB - Elsevier CY - Amsterdam AN - OPUS4-12844 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -