TY - CONF A1 - Ewert, Uwe A1 - Deresch, Andreas A1 - Bellon, Carsten A1 - Jaenisch, Gerd-Rüdiger ED - Chimenti, D.E. ED - Bond, L.J. ED - Thompson, D.O. T1 - A benchmark concept for simulation in radiographic testing T2 - 40th Annual review of progress in quantitative nondestructive evaluation (Proceedings) N2 - The new standard ISO 17636–2:2013 'NDT of welds: Radiographic testing - Part 2: X- and gamma ray techniques with digital detectors' describes a complex procedure for film replacement by phosphor imaging plates and digital detector arrays. RT modeling software should consider these detector types, X-ray film, and the standard requirements for image quality. Practitioners expect the same visibility of image quality indicators (IQI) in the simulated radiographs as in the experimental exposures. The proposed benchmark test is based on the comparison of experimental radiographs taken at BAM with modeled ones of participants. The experimental setup and the determination of the equivalent penetrameter sensitivity (EPS) as described in the procedure of ASTM E 746 are used for quantitative evaluation of the achievable contrast sensitivity for step hole IQIs as considered in Annex B of ISO 17636-2. System classification data for Computed Radiography (CR) and film systems will be provided by BAM according to ISO 11699–1 for selected film systems and according to ASTM E 2446 for selected CR systems. The classification of films and digital detectors is based on the measurement of the dose response function, the basic spatial resolution (SRb) of the image, and the measured image noise, which depends on the detector efficiency, the quantum statistics, and the detector fixed pattern noise. T2 - 40th Annual review of progress in quantitative nondestructive evaluation CY - Baltimore, Maryland, USA DA - 21.07.2013 KW - Digital radiography KW - Computed radiography KW - Benchmark KW - EPS KW - Modeling KW - Simulation KW - Contrast to noise ratio KW - Observer model PY - 2014 SN - 978-0-7354-1212-5 SN - 978-0-7354-1211-8 DO - https://doi.org/10.1063/1.4865044 SN - 0094-243X N1 - Serientitel: AIP conference proceedings – Series title: AIP conference proceedings VL - 33A SP - 1816 EP - 1823 PB - AIP Publishing AN - OPUS4-30904 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -