TY - CONF A1 - Fischer, Tobias A1 - Hecht, M. A1 - Dietrich, P. A1 - Unger, Wolfgang A1 - Nutsch, A. A1 - Streeck, C. A1 - Weser, J. A1 - Beckhoff, B. A1 - Rurack, Knut T1 - Application of dual-mode XPS and fluorescence labels in the quantification of surface functional groups T2 - 15th European Conference on Applications of Surface and Interface Analysis 2013 (ECASIA'13) T2 - 15th European Conference on Applications of Surface and Interface Analysis 2013 (ECASIA'13) CY - Sardinia, Italy DA - 2013-10-13 PY - 2013 AN - OPUS4-29566 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -