TY - JOUR A1 - Straub, Franka A1 - Wirth, Thomas A1 - Hertwig, Andreas A1 - Hodoroaba, Vasile-Dan A1 - Unger, Wolfgang A1 - Böllinghaus, Thomas T1 - Imaging the microstructure of duplex stainless steel samples with TOF-SIMS T2 - Surface and interface analysis N2 - Time-of-flight secondary ion mass spectrometry (TOF-SIMS) mappings provide a visualization of the distribution of chemical elements and phases on polished duplex steel surfaces as element and fragment secondary ion signals. The advantage of TOF-SIMS, compared to optical microscopy, is its potential to analyze the chemical composition with a lateral resolution at a submicrometer scale. TOF-SIMS mappings allow distinguishing between ferritic and austenitic phases because of the phase selective detection method without any requirement of etching or other processing. PB - Wiley CY - Chichester KW - TOF-SIMS mappings KW - Duplex stainless steel KW - Surface analysis KW - Ferritic phase KW - Austenitic phase PY - 2010 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/21818 AN - OPUS4-21818 UR - http://onlinelibrary.wiley.com/doi/10.1002/sia.3385/pdf SN - 0142-2421 SN - 1096-9918 VL - 42 IS - 6-7 SP - 739 EP - 742 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany