TY - JOUR A1 - Strüder, L. A1 - Hartmann, R. A1 - Holl, P. A1 - Ihle, S. A1 - Huth, M. A1 - Schmidt, J. A1 - Tham, Ch. A1 - Kanngießer, B. A1 - Baumann, J. A1 - Renno, A. A1 - Grenzer, J. A1 - Radtke, Martin A1 - Abboud, A. A1 - Pietsch, U. A1 - Soltau, H. T1 - High Speed, High Resolution imaging spectrometers based on pnCCDs for XRF and XRD applications JF - Microscopy and Microanalysis N2 - For many years pnCCDs have been well known as X-ray detectors for spectroscopic imaging in many fields of science: X-Ray Fluorescence analysis (XRF), X-ray Diffraction (XRD) with light sources in large accelerator facilities as well as with laboratory light sources or with X-rays from celestial sources in X-ray astronomy. A brief introduction in GEXRF (Grazing Emission XRF) measurements with a laboratory laser produced plasma source will be given, PIXE (Particle Induced X-ray Emission) measurements and D2XRF (Double Dispersive X-Ray Fluorescence) and Slicing experiments with pnCCDs coupled to polycapillary optics performed at the BESSY synchrotron will be shown. Energy-dispersive Laue diffraction with ultra-hard X-rays for the analysis of defects in metals will conclude the overview of spectroscopic X-ray imaging measurements in the field of structure and dynamics of matter. KW - PnCCD KW - Synchrotron KW - XRF PY - 2016 DO - https://doi.org/10.1017/S1431927616001355 VL - 22 IS - S3 SP - 100 EP - 101 AN - OPUS4-38884 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -