TY - JOUR A1 - Procop, Mathias T1 - XPS data for sputter-cleaned In0.53Ga0.47As, GaAs, and InAs surfaces JF - Journal of electron spectroscopy and related phenomena PY - 1992 UR - http://www.sciencedirect.com/science?_ob=PublicationURL&_tockey=%23TOC%235251%231992%23999409998%23276008%23FLP%23&_cdi=5251&_pubType=J&_auth=y&_acct=C000049503&_version=1&_urlVersion=0&_userid=963821&md5=dc56897f6b3c86cf4d7ea713dee69341 SN - 0368-2048 SN - 1873-2526 VL - 59 SP - R1 EP - R10 PB - Elsevier CY - Amsterdam AN - OPUS4-7092 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -