TY - CHAP A1 - Maiwald, Michael A1 - Gornushkin, Igor B. A1 - Ostermann, Markus ED - Gauglitz, G. ED - Moore, D.S. T1 - Trends in spectroscopic techniques for process control T2 - Handbook of spectroscopy - 2nd Ed. N2 - New developments in spectroscopic techniques for process control are, in general, driven by shortcomings of existing technology, for example, when sensitivity, selectivity, robustness, and so forth do not meet the demands. The perfect process analytical method would be based on a robust and easy to handle customized technique operating in real time, come without any need for calibration, that is, be an absolute method, have a professional support, and be compliant to increasing regulatory requirements. However, there are at least trends toward such an all-in-one device suitable for every purpose. Small, low-field NMR systems equipped with permanent magnet technology have been developed and allow for quantitative analysis as on-line instruments in a production environment. Quantitative high-resolution on-line NMR spectroscopy contributes to process understanding in pilot plant and research environments. Laser spectroscopy is a promising field in process analysis owing to its sensitivity and selectivity. Laser-induced breakdown spectroscopy LIBS is a promising field for direct in situ analysis and remote sensing. Applications of quantum-cascade lasers for process analytical applications are a promising technique. Techniques such as cavity ring-down spectroscopy (CRDS), tunable diode laser absorption spectroscopy (TDLAS), and photothermal techniques are briefly introduced. Recent developments of new detectors have improved X-ray fluorescence analysis (XRF) for qualitative and quantitative on-line evaluation of the elementary composition of liquid or solid samples, regardless of whether compact or bulk material. The chapter also introduces miscellaneous techniques such as ion mobility spectroscopy (IMS), microwave and dielectric spectroscopy, terahertz spectroscopy, ultrasonic acoustic spectroscopy, and other methods. KW - Process analytical technology (PAT) KW - NMR spectroscopy KW - IMS KW - CRDS KW - TDLAS KW - LIBS KW - Prozessanalytik KW - X-ray fluorescence KW - Terahertz spectroscopy PY - 2014 SN - 978-3-527-32150-6 DO - https://doi.org/10.1002/9783527654703.ch41 VL - 3 SP - Chapter 41, 1419 EP - 1438 PB - Wiley-VCH AN - OPUS4-31859 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -