TY - JOUR A1 - Meyer, S. A1 - Richter, S. A1 - Balski, Matthias A1 - Hagendorf, C. T1 - Trace element analysis in crystalline silicon T2 - Photovoltaics international PB - Semiconductor Media CY - London PY - 2011 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/25284 AN - OPUS4-25284 SN - 1757-1197 VL - 14th Edition IS - 4th Quarter, November SP - 34 EP - 39 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany