TY - GEN A1 - Senoner, Mathias T1 - Assessment of SIMS as an analytical tool in nanotechnology T2 - SIMS Europe 2000 T2 - SIMS Europe 2000 CY - Münster, Germany DA - 2000-09-18 PY - 2000 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/6114 AN - OPUS4-6114 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany